The possibility of obtaining quantitative XRFanalysis in archaeometric applications is considered in the following cases: (i) Examinations of metallic objects with irregular surface: coins, for instance. (ii) Metallic objects with a natural or artificial patina on the surface. (iii) Glass or ceramic samples for which the problems for quantitative analysis rise from the non-detectability of matrix low Z elements. The fundamental parameter method for quantitative XRFanalysis is based on a numerical procedure involving he relative values of XRFlines intensity. As a consequence it can be applied also to the experimental XRFspectra obtained for metallic objects if the correction for the irregular shape consists only in introducing a constant factor which does not affect the XRFintensity relative value. This is in fact possible in non-very-restrictive conditions for the experimental set up. The finenesses of coins with a superficial patina can be evaluated by resorting to the measurements of Rayleigh to Compton scattering intensity ratio at an incident energy higher than the one of characteristic X-ray. For glasses and ceramics the measurements of the Compton scattered intensity of the exciting radiation and the use of a proper scaling law make possible to evaluate the matrix absorption coefficients for all characteristic X-ray line energies.
Radiation applications in art and archaeometry : X-ray fluorescence applications to archaeometry : possibility of obtaining non destructive quantitative analyses / M. Milazzo. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 213(2004), pp. 683-692.
Radiation applications in art and archaeometry : X-ray fluorescence applications to archaeometry : possibility of obtaining non destructive quantitative analyses
M. MilazzoPrimo
2004
Abstract
The possibility of obtaining quantitative XRFanalysis in archaeometric applications is considered in the following cases: (i) Examinations of metallic objects with irregular surface: coins, for instance. (ii) Metallic objects with a natural or artificial patina on the surface. (iii) Glass or ceramic samples for which the problems for quantitative analysis rise from the non-detectability of matrix low Z elements. The fundamental parameter method for quantitative XRFanalysis is based on a numerical procedure involving he relative values of XRFlines intensity. As a consequence it can be applied also to the experimental XRFspectra obtained for metallic objects if the correction for the irregular shape consists only in introducing a constant factor which does not affect the XRFintensity relative value. This is in fact possible in non-very-restrictive conditions for the experimental set up. The finenesses of coins with a superficial patina can be evaluated by resorting to the measurements of Rayleigh to Compton scattering intensity ratio at an incident energy higher than the one of characteristic X-ray. For glasses and ceramics the measurements of the Compton scattered intensity of the exciting radiation and the use of a proper scaling law make possible to evaluate the matrix absorption coefficients for all characteristic X-ray line energies.Pubblicazioni consigliate
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