We investigated a suspended bilayer graphene where the bottom/top layer is doped by boron/nitrogen substitutional atoms. By using density functional theory calculations, we found that at high dopant concentration (one B-N pair every 32 C atoms), the electronic structure of the bilayer does not depend on the B-N distance but on the relative occupation of the bilayer graphene sublattices by B and N. The presence of the dopants and the consequent charge transfer establish a built-in electric field between the layers, giving rise to an energy gap. We further investigated the electronic transport properties and found that intralayer current is weakly influenced by the presence of these dopants while the interlayer one is enhanced for biases, allowing an easy tunneling between layers. This effect leads to current rectification in asymmetric junctions.

Electronic transport in B-N substituted bilayer graphene nanojunctions / D. Giofré, D. Ceresoli, G. Fratesi, M.I. Trioni. - In: PHYSICAL REVIEW. B. - ISSN 2469-9950. - 93:20(2016), pp. 205420.1-205420.5. [10.1103/PhysRevB.93.205420]

Electronic transport in B-N substituted bilayer graphene nanojunctions

G. Fratesi
Penultimo
;
2016

Abstract

We investigated a suspended bilayer graphene where the bottom/top layer is doped by boron/nitrogen substitutional atoms. By using density functional theory calculations, we found that at high dopant concentration (one B-N pair every 32 C atoms), the electronic structure of the bilayer does not depend on the B-N distance but on the relative occupation of the bilayer graphene sublattices by B and N. The presence of the dopants and the consequent charge transfer establish a built-in electric field between the layers, giving rise to an energy gap. We further investigated the electronic transport properties and found that intralayer current is weakly influenced by the presence of these dopants while the interlayer one is enhanced for biases, allowing an easy tunneling between layers. This effect leads to current rectification in asymmetric junctions.
systems
Settore FIS/03 - Fisica della Materia
2016
Article (author)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/387232
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