An acid aqueous sulphate electrolyte is proposed for the low temperature direct electrochemical growth of single-phase polycrystalline ZnTe. Single-crystal n+-GaAs and amorphous electroless Ni-P were used as substrates. The relationship between electrochemical growth conditions and the crystalline structure of as-deposited ZnTe were disclosed and correlated to the cathode chemistry during the growth process. Under suitable plating conditions the removal of tellurium (Te) excess from the deposit can be achieved, resulting in stoichiometric ZnTe. The nucleation of ZnTe was assessed through morphology observations by scanning electron microscopy: an instantaneous type prevails on GaAs and a progressive one on amorphous Ni-P. Chemical depth profiles of Zn and Te were investigated by X-ray photoelectron spectrometry measurements.

Electrodeposition of stoichiometric polycrystalline ZnTe on n+-GaAs and Ni-P / B. Bozzini, C. Lenardi, N. Lovergine. - In: MATERIALS CHEMISTRY AND PHYSICS. - ISSN 0254-0584. - 66:2-3(2000), pp. 219-228. ((Intervento presentato al convegno Italian Crystal Growth Symposium tenutosi a Napoli nel 1999.

Electrodeposition of stoichiometric polycrystalline ZnTe on n+-GaAs and Ni-P

C. Lenardi
Secondo
;
2000

Abstract

An acid aqueous sulphate electrolyte is proposed for the low temperature direct electrochemical growth of single-phase polycrystalline ZnTe. Single-crystal n+-GaAs and amorphous electroless Ni-P were used as substrates. The relationship between electrochemical growth conditions and the crystalline structure of as-deposited ZnTe were disclosed and correlated to the cathode chemistry during the growth process. Under suitable plating conditions the removal of tellurium (Te) excess from the deposit can be achieved, resulting in stoichiometric ZnTe. The nucleation of ZnTe was assessed through morphology observations by scanning electron microscopy: an instantaneous type prevails on GaAs and a progressive one on amorphous Ni-P. Chemical depth profiles of Zn and Te were investigated by X-ray photoelectron spectrometry measurements.
ZnTe; electrodeposition; XPS
Settore FIS/01 - Fisica Sperimentale
2000
Article (author)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/352750
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