A new approach to Persistent Scatterer Interferometry (PSI) data processing and analysis implemented in the PSI chain of the Geomatics (PSIG) Division of CTTC is used in this work. The flexibility of the PSIG procedure allowed evaluating two different processing chains of the PSIG procedure. A full PSIG procedure was implemented in the TerraSAR-X dataset while a reduced PSIG procedure was applied to the nine Sentinel-1 images available at the time of processing. The performance of the PSIG procedure is illustrated using X-band and C-band Sentinel-1 data and several examples of deformation maps covering different types of deformation phenomena are shown. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
The PSIG procedure to Persistent Scatterer Interferometry (PSI) using X-band and C-band Sentinel-1 data / M. Cuevas González, N. Devanthéry, M. Crosetto, O. Monserrat, B. Crippa (PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING). - In: SAR Image Analysis, Modeling, and Techniques[s.l] : SPIE, 2015 Oct. - ISBN 9781628418521. - pp. 1-7 (( Intervento presentato al 15. convegno SAR Image Analysis, Modeling, and Techniques tenutosi a Toulouse nel 2015 [10.1117/12.2194984].
The PSIG procedure to Persistent Scatterer Interferometry (PSI) using X-band and C-band Sentinel-1 data
B. CrippaUltimo
2015
Abstract
A new approach to Persistent Scatterer Interferometry (PSI) data processing and analysis implemented in the PSI chain of the Geomatics (PSIG) Division of CTTC is used in this work. The flexibility of the PSIG procedure allowed evaluating two different processing chains of the PSIG procedure. A full PSIG procedure was implemented in the TerraSAR-X dataset while a reduced PSIG procedure was applied to the nine Sentinel-1 images available at the time of processing. The performance of the PSIG procedure is illustrated using X-band and C-band Sentinel-1 data and several examples of deformation maps covering different types of deformation phenomena are shown. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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