We present a novel technique for particle sizing based on recent studies about the statistical information contained within the light intensity distribution close to a disordered sample. We show that it is much simpler and more robust than the traditional light scattering methods and any imaging technique. Applications to optical diagnostics, process monitoring and pollution monitoring are expected. In principle, since the basic phenomenon is wavelength independent, radiation other than visible light can be used.

A new particle sizing technique based on near field scattering / M.A.C. Potenza, D. Pescini, D. Magatti, F. Ferri, M. Giglio. - In: NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS. - ISSN 0920-5632. - 150:1-3(2006), pp. 334-338. [10.1016/j.nuclphysbps.2005.04.066]

A new particle sizing technique based on near field scattering

M.A.C. Potenza
Primo
;
M. Giglio
Ultimo
2006

Abstract

We present a novel technique for particle sizing based on recent studies about the statistical information contained within the light intensity distribution close to a disordered sample. We show that it is much simpler and more robust than the traditional light scattering methods and any imaging technique. Applications to optical diagnostics, process monitoring and pollution monitoring are expected. In principle, since the basic phenomenon is wavelength independent, radiation other than visible light can be used.
Particle sizing technique ; near field scattering ; light intensity distribution ; light scattering methods ; imaging technique ; optical diagnostics ; process monitoring ; pollution monitoring
Settore FIS/03 - Fisica della Materia
2006
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/22750
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