A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

Silicon detector system for high rate EXAFS application / A. Pullia, H. Kraner, D. Siddons, L. Furenlid, G. Bertuccio - In: 1994 IEEE Nuclear science symposium conference record. Volume 1Piscataway, USA : IEEE, 1995. - ISBN 0-7803-2544-3. - pp. 463-467 (( convegno Nuclear science symposium and medical imaging conference tenutosi a Norfolk, VA, USA nel 1994 [10.1109/NSSMIC.1994.474340].

Silicon detector system for high rate EXAFS application

A. Pullia
Primo
;
1995

Abstract

A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.
silicon detectors ; segmented detectors ; X ray spectroscopy ; extended X ray absorption fine structure
Settore ING-INF/01 - Elettronica
Settore FIS/01 - Fisica Sperimentale
Settore FIS/04 - Fisica Nucleare e Subnucleare
1995
IEEE
Book Part (author)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/209203
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