High-resistivity silicon diode detectors integrable in array structures have been tested for high-resolution X-ray spectroscopy at various temperatures. Using an inexpensive commercially available front-end transistor we have obtained resolutions of 19 electrons rms, or 165 eV FWHM, at -35°C and 39 electrons rms, or 320 eV FWHM, at 26°C, with 3 and 1 μs shaping times. The obtained resolution values are adequate for synchrotron light based EXAFS experiments. These reliable detectors can be suitably employed for high-performance multichannel systems in which high-rate capability is achieved by using an array of detectors operated in parallel. A 16-element detector prototype has been recently assembled, installed and successfully operated for a real EXAFS experiment at NSLS.
New results with silicon pad detectors and low-noise electronics for absorption spectrometry / A. Pullia, H. Kraner, L. Furenlid. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 395:3(1997), pp. 452-456.
New results with silicon pad detectors and low-noise electronics for absorption spectrometry
A. PulliaPrimo
;
1997
Abstract
High-resistivity silicon diode detectors integrable in array structures have been tested for high-resolution X-ray spectroscopy at various temperatures. Using an inexpensive commercially available front-end transistor we have obtained resolutions of 19 electrons rms, or 165 eV FWHM, at -35°C and 39 electrons rms, or 320 eV FWHM, at 26°C, with 3 and 1 μs shaping times. The obtained resolution values are adequate for synchrotron light based EXAFS experiments. These reliable detectors can be suitably employed for high-performance multichannel systems in which high-rate capability is achieved by using an array of detectors operated in parallel. A 16-element detector prototype has been recently assembled, installed and successfully operated for a real EXAFS experiment at NSLS.
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