This article provides an overview of the IEEE Instrumentation and Measurement Society Technical Committee TC-22 on Intelligent Measurement Systems (https://ieee-ims.org/technical-committee/tc-22). The scope of the TC-22 is related to fostering development and use of artificial intelligence, computational intelligence, and soft computing in measurement systems and related applications.
IMS Technical Committee TC-22: Intelligent Measurement Systems / A. Genovese, M. Siegel. - In: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE. - ISSN 1094-6969. - 24:8(2021 Nov 01), pp. 14-17. [10.1109/MIM.2021.9580792]
IMS Technical Committee TC-22: Intelligent Measurement Systems
A. Genovese
Secondo
;
2021
Abstract
This article provides an overview of the IEEE Instrumentation and Measurement Society Technical Committee TC-22 on Intelligent Measurement Systems (https://ieee-ims.org/technical-committee/tc-22). The scope of the TC-22 is related to fostering development and use of artificial intelligence, computational intelligence, and soft computing in measurement systems and related applications.
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