We report the observation by scanning electron microscopy, spatially resolved Auger electron spectroscopy, and atomic force microscopy of the thermal evolution of a microsized array of carbon dots, fabricated using supersonic cluster beam deposition through a stencil mask. We show that it is possible to obtain ordered arrays of silicon carbide microsized dots by reaching the temperature necessary for the creation of Si-C bonds, without affecting the geometry of the pristine pattern.

Cluster beam microfabrication of SiC pattern on Si(100) / E. Magnano, M. Padovani, V. Spreafico, M. Sancrotti, A. Podestà, E. Barborini, P. Piseri, P. Milani. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 544:2-3(2003), pp. L709-L714.

Cluster beam microfabrication of SiC pattern on Si(100)

A. Podestà;P. Piseri
Penultimo
;
P. Milani
Ultimo
2003

Abstract

We report the observation by scanning electron microscopy, spatially resolved Auger electron spectroscopy, and atomic force microscopy of the thermal evolution of a microsized array of carbon dots, fabricated using supersonic cluster beam deposition through a stencil mask. We show that it is possible to obtain ordered arrays of silicon carbide microsized dots by reaching the temperature necessary for the creation of Si-C bonds, without affecting the geometry of the pristine pattern.
Atomic force microscopy; Carbon; Clusters; Scanning electron microscopy (SEM); Silicon carbide
Settore FIS/03 - Fisica della Materia
2003
Article (author)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/66462
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