The composition of γ-FeOOH layers deposited by anodic oxidation of Fe2+ from NaCI solutions has been investigated by Auger electron spectroscopy depth profiling. In different samples the O/Fe ratio varied in a continuous and reproducible way along the layer thickness. The observed features and the detection of Cl- suggest that all of the layer is involved in a hydration process. The results are used to discuss the growth mechanism of the oxide. © 1988.
AES depth profiling of electrochemically grown γ-FeOOH / S. Ardizzone, L. Formaro. - In: JOURNAL OF ELECTROANALYTICAL CHEMISTRY AND INTERFACIAL ELECTROCHEMISTRY. - ISSN 0022-0728. - 246:1(1988), pp. 53-61.
AES depth profiling of electrochemically grown γ-FeOOH
S. ArdizzonePrimo
;L. FormaroUltimo
1988
Abstract
The composition of γ-FeOOH layers deposited by anodic oxidation of Fe2+ from NaCI solutions has been investigated by Auger electron spectroscopy depth profiling. In different samples the O/Fe ratio varied in a continuous and reproducible way along the layer thickness. The observed features and the detection of Cl- suggest that all of the layer is involved in a hydration process. The results are used to discuss the growth mechanism of the oxide. © 1988.
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